J
Jim Granville
Guest
lecroy7200@chek.com wrote:
<snip>
They also spec a MAX peak current.
There IS another failure mode, which is the lateral currents that result
from the clamp diodes ( which are actually side-ways transistors ).
It is not easy to KNOW what peak currents you get, especially on cable
or external runs.
At the highest levels, these injection currents cause latch-up, but
there can be lower levels, where operation is compromised, but the
device does not latch up.
Latchup tests are purely "did the SCR trigger?" ones, they do NOT
(AFAIK) ever check to see if the part logically miss-fired in any way.
-jg
<snip>
That's from a Pin-failure viewpoint. - ie energy damage.As per our off-line talks, I have gone ahead and rebuilt the design
using slew limited outputs for the two pins in question. I have begun
running my transient tests but it will be a few weeks before I am
convinced this was the problem.
The following link is to my post about the reflected energy causing
possible problems:
http://groups-beta.google.com/group/comp.arch.fpga/browse_frm/thread/1423e577bf37d509/1f921b2ef9ae4542?q=reflected&rnum=3#1f921b2ef9ae4542
The following was taken from a Xilinx app. note.
"For all FPGA families, ringing signals are not a cause for reliability
concerns. To cause such a problem, the Absolution Maximum DC conditions
need to be violated for a considerable amount of time (seconds). "
snip
They also spec a MAX peak current.
There IS another failure mode, which is the lateral currents that result
from the clamp diodes ( which are actually side-ways transistors ).
It is not easy to KNOW what peak currents you get, especially on cable
or external runs.
At the highest levels, these injection currents cause latch-up, but
there can be lower levels, where operation is compromised, but the
device does not latch up.
Latchup tests are purely "did the SCR trigger?" ones, they do NOT
(AFAIK) ever check to see if the part logically miss-fired in any way.
-jg