F
Fred Bloggs
Guest
On Friday, October 7, 2022 at 4:41:24 PM UTC-4, John Walliker wrote:
Well I would and here\'s why. The ultra-fast (for its day) rise/fall times of the logic family brought transmission line effects into standard logic design. If the typical LS output gate transitioned a typical high impedance interconnecting trace to 5V, and that 5V pulse meets a high impedance input of another LS gate as its only load. The signal will be reflected 100% positively for 5V traveling back down the trace to the driver. Since the driver pulled high is high impedance, the returning pulse again is reflected positively 100% making the voltage at the driver output 10V. The new +5V transition sends a 10V edge traveling down the line to the LS input and gets clamped at 5V which is a full negative reflection to return back to the driver and reduce the 10V at the output node ideally to 5V etc. So we know for a *fact* the process has to be designed to withstand a repetitive 10V applied to the output. And that\'s not just withstand to survive, that\'s withstand with no internal circuit disruption. Typical margins are factor of 2x or more, making a withstanding voltage of 20V a done deal, and that can be verified for the part. That\'s why I\'m saying it\'s a good design.
On Friday, 7 October 2022 at 18:25:51 UTC+1, Fred Bloggs wrote:
On Thursday, October 6, 2022 at 10:50:15 AM UTC-4, John Larkin wrote:
snip gibberish
That\'s not clear. Got a schematic?
He\'s wasting his time, there\'s nothing wrong with the original circuit.
He\'s just one of those people who, when they can\'t understand something, think something is wrong.
LS doesn\'t have ESD clamp diodes on its outputs, and, in fact, nothing is being avalanched by applying a very current limited 20V to its outputs. Maybe an insignificant elevated leakage is all that happens. The original circuit is well-designed and should be left as is.
I can see that the original circuit might work fine, but it does depend on parameters that
are not specified in the data sheet like the breakdown voltage of the output pull-down
transistor, so I wouldn\'t be comfortable calling it \"well designed\".
Well I would and here\'s why. The ultra-fast (for its day) rise/fall times of the logic family brought transmission line effects into standard logic design. If the typical LS output gate transitioned a typical high impedance interconnecting trace to 5V, and that 5V pulse meets a high impedance input of another LS gate as its only load. The signal will be reflected 100% positively for 5V traveling back down the trace to the driver. Since the driver pulled high is high impedance, the returning pulse again is reflected positively 100% making the voltage at the driver output 10V. The new +5V transition sends a 10V edge traveling down the line to the LS input and gets clamped at 5V which is a full negative reflection to return back to the driver and reduce the 10V at the output node ideally to 5V etc. So we know for a *fact* the process has to be designed to withstand a repetitive 10V applied to the output. And that\'s not just withstand to survive, that\'s withstand with no internal circuit disruption. Typical margins are factor of 2x or more, making a withstanding voltage of 20V a done deal, and that can be verified for the part. That\'s why I\'m saying it\'s a good design.
John