Guest
Hi,
take a very simple LC oscillator like this:
o VCC
|
|
|-+
+------+------->|
| | |-+ N-FET
| | |
C === |
C | C/2 |
C | |
C +----------+
C | |
C | |Ż|
C === | |
| L | C/2 |_| R
| | |
=== === ==
If all components were noiseless, this would oscillate at an ideally
stable frequency close to 2*pi*f0 = 1/(L*C)^(1/2). Some frequency
offset
will result from the internal capacitances and phase lag of the FET,
and
harmonics will be introduced by its transfer characteristic. Assume the
tank L/C to be chosen such that the FET is only mildly non-linear, i.e.
that it doesn't turn off completely during a cycle.
In reality, the resistors as well as the FET channel inject a thermal
voltage noise of (4*kB*T*R)^(1/2), or alternatively a current noise of
(4*kB*T/R)^(1/2). This will cause the oscillator frequency to fluctuate
around f0. If you repeately measure the average frequency over a fixed
duration tau, the scatter of your results should decrease with
increasing
tau, however.
Now my question: is it possible to predict the average frequency offset
for a given tau from the values of the circuit components? I would
naively
expect the answer to depend on the tank circuit quality factor, so a
coil
resistance RL might have to be introduced as well. But then, R makes
for tank circuit damping too.
If specific data can help, take my test circuit data of L=550uH,
C=11nF,
RL=2ohm, R=1kohm, BF245A (IDSS=4mA, VTO=-1.7V) for the N-FET, VCC=9V,
and
tau=10sec. (The circuit is temperature-compensated to about 1ppm/deg
and
packed in styrofoam, where C and L are in good thermal contact.)
TIA,
Martin.
take a very simple LC oscillator like this:
o VCC
|
|
|-+
+------+------->|
| | |-+ N-FET
| | |
C === |
C | C/2 |
C | |
C +----------+
C | |
C | |Ż|
C === | |
| L | C/2 |_| R
| | |
=== === ==
If all components were noiseless, this would oscillate at an ideally
stable frequency close to 2*pi*f0 = 1/(L*C)^(1/2). Some frequency
offset
will result from the internal capacitances and phase lag of the FET,
and
harmonics will be introduced by its transfer characteristic. Assume the
tank L/C to be chosen such that the FET is only mildly non-linear, i.e.
that it doesn't turn off completely during a cycle.
In reality, the resistors as well as the FET channel inject a thermal
voltage noise of (4*kB*T*R)^(1/2), or alternatively a current noise of
(4*kB*T/R)^(1/2). This will cause the oscillator frequency to fluctuate
around f0. If you repeately measure the average frequency over a fixed
duration tau, the scatter of your results should decrease with
increasing
tau, however.
Now my question: is it possible to predict the average frequency offset
for a given tau from the values of the circuit components? I would
naively
expect the answer to depend on the tank circuit quality factor, so a
coil
resistance RL might have to be introduced as well. But then, R makes
for tank circuit damping too.
If specific data can help, take my test circuit data of L=550uH,
C=11nF,
RL=2ohm, R=1kohm, BF245A (IDSS=4mA, VTO=-1.7V) for the N-FET, VCC=9V,
and
tau=10sec. (The circuit is temperature-compensated to about 1ppm/deg
and
packed in styrofoam, where C and L are in good thermal contact.)
TIA,
Martin.