P
pawihte
Guest
Are standard CMOS logic ICs any more susceptible to damage from
external causes than BJT devices via the OUTput terminals? By
external causes, I mean things like ESD or a mild leakage current
from the mains supply.
As an example, suppose an output from a 4000 series logic gate is
intended to drive an external load, but may be left open at
times. Assume that it goes to the output terminal through a
series resistor (say a few kilohms as a buffer against capacitive
loads) but has no resistive path to ground when it's disconnected
from the load.
external causes than BJT devices via the OUTput terminals? By
external causes, I mean things like ESD or a mild leakage current
from the mains supply.
As an example, suppose an output from a 4000 series logic gate is
intended to drive an external load, but may be left open at
times. Assume that it goes to the output terminal through a
series resistor (say a few kilohms as a buffer against capacitive
loads) but has no resistive path to ground when it's disconnected
from the load.