B
blisca
Guest
I wonder if the accuracy is granted by the process itself,by testing samples,or automatic test one by one;
the last would be amazing in case of very cheap and very small resistors(or other passive components).The same question could be extended to semiconductors,despite test on wafer is probably easier, by mechanical point of view,what about the sealed component?
Thanks and forgive improper use of english language.
Diego
the last would be amazing in case of very cheap and very small resistors(or other passive components).The same question could be extended to semiconductors,despite test on wafer is probably easier, by mechanical point of view,what about the sealed component?
Thanks and forgive improper use of english language.
Diego